Scope of Service:

• • SEM, EDX, and analySISTM software, operated by an Eltron technician
• • 1280x 960 pixel x 8 bit resolution digital pictures on CD-ROM
• • Hard Copy report with measurements, spectrum annotation and elemental identification information

• SEM and EDX Rental includes the following:

• • Surface, cross-section, fracture and fiber topography
• • Grain and particle size measurement
• • High magnification up to 100,000
• • X-ray analysis spectrum and identification
• • Line profile analysis between any two defined points
• • Spotlight mode to identify points on image and collect spectra from those points
• • Elemental mapping and coloring of present phases
• • Second Phase, porosity, surface area, and thickness measurements

• Material examples:

• • Electrochemical and catalysis related membranes
• • Ceramics, metals, composites, glasses and polymers
• • Mounted micron and nanoparticle powders
• • Metal films

Performance Specs:

• • Mangnification: X18 - 300,000 (with conductive sample prep)
• • SEI / Si-Li EDX Detection
• • Phase Analysis, Surface Area and Thickness Measurements
• • 0.5 - 30 kV
• • X-ray Elemental Mapping, Spot and Line Profile Analysis
• • Digital Images and Maps in CD-ROM Format